화학공학소재연구정보센터
Electrochimica Acta, Vol.51, No.14, 2971-2976, 2006
On the dependence of the Nernst diffusion layer thickness on potential and sweep rate for reversible and of the thickness of the charge transfer layer for irreversible processes studied by application of the linear potential sweep method
In this paper, a discussion is made of the dependence between the diffusion layer thickness and the potential sweep rate and the potential value for reversible charge transfer processes studied under the application of a linear potential sweep. Also the equivalent circuit for that type of processes is remembered as well as the concept of conductance. The same concepts are discussed for the case of irreversible charge transfer processes studied also by linear potential sweep voltammetry. A consideration is made of the concept of general conductance as utilised in electrochemical processes and the results of its utilisation are compared with those obtained by using the physical definition of conductance and discussed. (c) 2005 Elsevier Ltd. All rights reserved.