Previous Article Next Article Table of Contents Thin Solid Films, Vol.488, No.1-2, 337-339, 2005 DOI10.1016/j.tsf.2004.09.025 Export Citation A new measurement technique for the characterization of carrier lifetime in thin SOI MOSFETs (vol 6, pg 462, 2004) Nakajima Y, Tomita H, Aoto K, Sasaki K, Hanajiri T, Toyabe T, Morikawa T, Sugano T Please enable JavaScript to view the comments powered by Disqus.
