화학공학소재연구정보센터
Journal of Physical Chemistry B, Vol.109, No.26, 12832-12836, 2005
Structural kinetics studies on phase transitions of the BiUPD layer between the (2x2) and (px root 3) structures using surface X-ray diffraction
The kinetics of the phase transition between the (2 x 2) and (p x root 3)-Bi structures on Au(1 1 1) was investigated using electrochemical methods and time-resolved surface X-ray diffraction. The temporal changes in the current value and the diffracted X-ray intensity that originated from the (2 x 2)-Bi overlayer were monitored during the phase transitions at various overpotentials. The phase transition models and kinetics parameters were deduced from each of the current and X-ray intensity transient curves. We also carried out comparative studies of the phase transition from the structural and electrochemical points of view. For the (p x root 3) (2 x 2) phase transition, the phase transition models determined by the X-ray and electrochemical measurements were a surface-diffusion controlled instantaneous nucleation-growth process and a Langmuir process, respectively. For the reverse transition, the phase transition models determined by X-ray and electrochemical measurements were a Langmuir adsorption process and a surface diffusion controlled nucleation-growth process, respectively. Our results revealed that the current transient curve does not always reflect the phase transition model in both cases and suggest that a structural analysis is fundamental in the phase transition studies. The disagreements between the phase transition models and their mechanisms are discussed.