Previous Article Next Article Table of Contents Journal of Materials Science, Vol.39, No.5, 1805-1807, 2004 DOI10.1023/B:JMSC.0000016190.65639.1d Export Citation Simple transmission ellipsometry method for measuring the electric-field-induced birefringence in PLZT thin films Wang J, Wang DY, Li F, Tang XG, Chan HLW, Mo D, Choy CL Please enable JavaScript to view the comments powered by Disqus.
