화학공학소재연구정보센터
Journal of the Korean Industrial and Engineering Chemistry, Vol.14, No.4, 386-390, June, 2003
XPS 깊이 분석법에 의한 고무-스틸코드 계면 분석
Rubber-Steel Cord Interface Analysis by XPS Depth-profile Technique
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초록
타이어의 가황 공정에서 생성되는 고무-스틸코드 계면층을 광전자분광기의 깊이분석법으로 분석하였다. 가황 공정에서 고무-스틸코드 사이에 거름종이를 삽입함으로써 계면을 수비고 깨끗하게 분리할 수 있었다. 깊이분석 데이터를 정량적으로 해석하여 계면층에서 생성되는 화합물의 상대적인 조성비와 화학적 결합 상태 등을 제시하였다. 계면층으 두께는 약 1000 Å이었으며, 외부 500 Å은 거의 대부분 CuxS가 생성되었고, 내부에는 ZnS, ZnO, 금속성 Cu 등이 서로 혼합되어 있었다.
Rubber-steel cord interfacial layer built up during vulcanization process was analyzed by XPS depth-profile technique. During vulcanization process, when filter paper was inserted between rubber and brass sheet, the interface was separated easily and clearly. Quantitative analyses of XPS depth-profile data revealed chemical bonding states and relative compositions of compounds in the interfacial layer. The thickness of interfacial layer formed was about 1000 Å. The outer layer was 500 Å that consisted of CuxS mainly, while the inner region consisted of a mixture of ZnS, ZnO and metallic-Cu.
  1. Tsai YM, Boerio FJ, vanOoij WJ, Kim DK, Rau T, Surf. Interface Anal., 23, 261 (1995) 
  2. Van Ooij WJ, Weening WE, Murray PF, Rubber Chem. Technol., 54, 227 (1980)
  3. Hammer GE, Auger Electron Spectroscopy and the Analysis of the Brass-rubber Adhesive Interphase, ACS Meeting, Rubber Division Paper No. 21 (1995)
  4. Mauer D, Adhesion Layer: Analytical Techniques, Handbook-Bekaert Technical Meeting 16th May (1997)
  5. Persoone P, Arkens O, New Analytical Method for Fundamental Steel Cord Rubber Adhesion Study, ACS Meeting, 71 (1997)
  6. Briggs D, Seah MP, Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, 515, John Wiley & Sons, New York (1983)
  7. Van Ooij WJ, Rubber Chem. Technol., 57, 421 (1983)