Journal of the Korean Industrial and Engineering Chemistry, Vol.14, No.4, 386-390, June, 2003
XPS 깊이 분석법에 의한 고무-스틸코드 계면 분석
Rubber-Steel Cord Interface Analysis by XPS Depth-profile Technique
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초록
타이어의 가황 공정에서 생성되는 고무-스틸코드 계면층을 광전자분광기의 깊이분석법으로 분석하였다. 가황 공정에서 고무-스틸코드 사이에 거름종이를 삽입함으로써 계면을 수비고 깨끗하게 분리할 수 있었다. 깊이분석 데이터를 정량적으로 해석하여 계면층에서 생성되는 화합물의 상대적인 조성비와 화학적 결합 상태 등을 제시하였다. 계면층으 두께는 약 1000 Å이었으며, 외부 500 Å은 거의 대부분 CuxS가 생성되었고, 내부에는 ZnS, ZnO, 금속성 Cu 등이 서로 혼합되어 있었다.
Rubber-steel cord interfacial layer built up during vulcanization process was analyzed by XPS depth-profile technique. During vulcanization process, when filter paper was inserted between rubber and brass sheet, the interface was separated easily and clearly. Quantitative analyses of XPS depth-profile data revealed chemical bonding states and relative compositions of compounds in the interfacial layer. The thickness of interfacial layer formed was about 1000 Å. The outer layer was 500 Å that consisted of CuxS mainly, while the inner region consisted of a mixture of ZnS, ZnO and metallic-Cu.
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