Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.20, No.3, 1135-1138, 2002 DOI10.1116/1.1481871 Export Citation Evidence of storing and erasing of electrons in a nanocrystalline-Si based memory device at 77 K Banerjee S, Huang SY, Yamanaka T, Oda S Please enable JavaScript to view the comments powered by Disqus.
