화학공학소재연구정보센터
Journal of Vacuum Science & Technology B, Vol.20, No.3, 1044-1047, 2002
Low-energy electron point source microscope as a tool for transport measurements of free-standing nanometer-scale objects: Application to carbon nanotubes
We have developed a simple and reliable technique for two-terminal transport measurements of free-standing wire-like objects. The method is based on the low-energy electron point source microscope. The field emission tip of the microscope is used as a movable electrode to make a well-defined local electrical contact on a controlled place of a nanometer-size object. This allows transport measurements of the object to be conducted. The technique was applied to carbon nanotube ropes.