The electronic and structural properties of amorphous carbon films have been studied by means of Raman and X-ray photoelectron spectroscopy. The films were deposited, under vacuum, by KrF excimer laser ablation of graphite targets. Both the substrate temperature and laser fluence were increased up to 900 K and 15 J cm(-2), respectively. The Raman spectra of the films deposited at room temperature showed the presence of a broad band peaked at nearly 1550 cm(-1) with a shoulder in the 1300-1400 cm(-1) region, with an sp(3) content ranging from 60 to 70%. Upon varying the laser fluence, only slight modifications in the Raman spectra were observed. On the contrary, increasing the substrate temperature increased the low-frequency component, suggesting an increase in the sp(2) content. This result is also supported by the lineshape modifications observed for the C is photoemission peak and by a possible reduction in the film density.