Thermochimica Acta, Vol.352-353, 87-90, 2000
DSC of silver-added indium-tin-oxide (ITO) transparent conductive materials
Chemical state of silver in the sintered sliver-added ITO (indium-tin-oxide, tin-doped In2O3) ceramics was investigated by X-ray diffraction analysis and high-temperature DSC, The X-ray diffraction peaks of metallic silver were detected for the specimens with >ca. 1 at.% Ag (as indicated by Ag/(Ag+Sn+In)). High-temperature DSC detected an endothermic peak at ca. 960 degrees, which agreed with the melting point of metallic silver and the exothermic peak during the cooling for all specimens. Therefore, chemical state of silver in the sintered silver-added ITO ceramics was interpreted as metallic.
Keywords:ITO transparent conductive films;sputtering target;metallic silver;X-ray diffraction;high-temperature DSC