Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.18, No.7, 581-583, 1999 DOI10.1023/A:1006651217517 Export Citation The use of high-energy synchrotron diffraction for residual stress analyses Reimers W, Pyzalla A, Broda M, Brusch G, Dantz D, Schmackers T, Liss KD, Tschentscher T Please enable JavaScript to view the comments powered by Disqus.
