Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.18, No.5, 355-357, 1999 DOI10.1023/A:1006664113573 Export Citation High-temperature X-ray diffraction and dilatometric studies on some oxygen ion conducting compounds Achary SN, Mathews MD, Patwe SJ, Tyagi AK Please enable JavaScript to view the comments powered by Disqus.
