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Journal of Vacuum Science & Technology A, Vol.18, No.5, 2608-2612, 2000
Effects of oxygen gettering and target mode change in the formation process of reactively sputtered Pt oxide thin films
Pt, and Pt oxide thin films were prepared by reactive sputtering of Pt in Ar and O-2 gas mixtures, and the influence of O-2 flow ratio On their formation process was studied. O-2 gettering by Pt atoms was confirmed from plasma emission spectra and pressure change in a sputtering chamber before and, after striking the discharge. At O-2 flow ratios below 20%, almost all of the introduced O-2 molecules were gettered and Pt films were deposited. At O-2 flow ratios above 20%, the number of supplied O-2 molecules overcame the gettering effect and the O-2 partial pressure began to increase, and Pt oxide films were deposited. The deposition rate of Pt oxide films decreased at O-2 flow ratios above 30%, because the target surface state changed from a metallic target mode to an oxide target mode.