C-60 polycrystalline films grown from physical vapor deposition are obtained. A surface morphology diagram in terms of the degree of supersaturation and the relative strength of bonding energy vs. thermal energy is determined from scanning electron microscopy, and discussed. The size of the grains in the high quality polycrystalline films is observed to depend sensitively on supersaturation and substrate temperature. X-Ray diffraction is applied, and the preferential orientations of these grains are in the (111), (220) and (311) directions.