Thin Solid Films, Vol.371, No.1-2, 195-200, 2000
Optical properties of CuAlX2 (X = Se, Te) thin films obtained by annealing of copper, aluminum and chalcogen layers sequentially deposited
Thin layers of copper, aluminum and chalcogen sequentially deposited by evaporation are annealed to synthesize CuAlX2 (X = Se, Tc) films. The films crystallized in the chalcopyrite structure. For CuAlSe2, three characteristic energy gaps of 2.66(6), 2.78(2), and 2.91(5) eV were obtained from an analysis of the optical transmission spectra in the wavelength range 350-800 nm. The energies of the spin-orbit and the crystal field were found to be, respectively, 162 meV and -143 meV. Reflectivity measurements in the far infrared yield four mode frequencies for CuAlSe2 and CuAlTe2.