Low manganese steel samples were yttrium implanted using ion implantation technique. Sample compositions and structures were investigated before and after yttrium implantations to determine the yttrium distribution in low manganese steel. Yttrium implantation depth profiles were characterized using conventional techniques such as X-ray photoelectron spectroscopy (XPS), reflection high energy electron diffraction (RHEED)I X-ray diffraction (XRD), glancing angle X-ray diffraction (GAXRD) and a nuclear analytical method: Rutherford backscattering spectroscopy (RBS). The aim of this study is to show that correlation between composition and structural analyses allows to understand the effect of implanting yttrium in low manganese steel.