The steady-state fluorescence properties of naphthalene-labeled polymers dispersed in poly(methyl methacrylate) (PMMA) cast films were studied under tensile loadings at 80 degreesC. The labeled polymers were composed of methyl methacrylate (MMA) and 1-naphthylmethyl methacrylate (NMMA). Three of the copolymers were used in this work, and the contents of NMMA were 0.59 mol % (CP1), 22.0 mol % (CP2), and 56.7 mol % (CP3), respectively. The fluorescence spectra of the films containing CP1 and CP2were unchanged during elongation. For the film containing CP3, the excited monomer emission of naphthyl groups at around 337 nm decreased with increasing applied tensile strain. The strain enhanced the emission ascribed to the excimer of the naphthyl groups in the region of 390-420 nm. The ratio of fluorescence intensities at 400 nm and 337 mn, I-400/I-337, increased with the applied strain, which indicates that CP3 is a sensitive probe for detecting the structural changes of polymer matrices. The obtained results mean that the excimer-forming sites in the PMMA films during elongation depend both on the applied strain and the concentration of naphthyl groups in the dispersed polymer probes.