The dynamic behavior of thin polymer films is of interest in the fabrication of microelectronics and optoelectronics and in the coatings industry. It is known that polymer relaxation is affected by film thickness and the particular substrate/polymer pair. We previously used a spectroscopic ellipsometer to investigate the glass transition in thin films. In addition to information on the modification of thermal transitions such as the glass-transition temperature, the speed of data acquisition in an automated, spectroscopic ellipsometer, operated at a single wavelength of 780 nm, allows for the direct observation of the isothermal dimensions of a thin polymer film as a function of time after a rapid temperature change. In this article, we discuss recent results from the observation of the time dependence of film-normal thickness and normalized, in-plane, lateral dimension as well as simple fits to this relaxation behavior in terms of a normalized viscosity and relaxation time. The results support a highly asymmetric initial thermal expansion normal to the film followed by close to isotropic relaxation and anisotropic "flow" (the flow in response to the vanishingly small shears of thermal expansion). These features may clarify issues involving the observation of chain confinement in thin polymer films in terms of potential differences between equilibrium and dynamic measurements.