Atomic force microscopy (AFM) and wide angle X-ray scattering (WAXS) were used to examine the morphology of hard domains in flexible polyurethane foams and plaques based on slabstock formulations. Ln plaque samples that were uniaxially deformed to 50% elongation, WAXS was utilized to demonstrate transverse hard se ment orientation relative to the axis of deformation. AFM was utilized to directly observe the morphology of the foams and plaques. Micrographs from this technique present, for the first time in polyurethane foam systems, lamellae-like structures ca. 0.2 mu m long and ca. 10 nm across. These structures are believed to be precipitates of polyurea hard segments and are considered to be responsible for the orientation behavior presented.