We use the time-stress correspondence (TSC) principle and consider creep compliance D data for a polymer liquid crystal (PLC). A master compliance plot is created from two stress sigma levels only; the lower stress level is the reference while the other set is shifted on the logarithmic time axis. The master plot so created is quite close to that constructed after a significant amount of experimentation at several cr levels. A formula for stress shift factor a(sigma) obtained by one of us is applied for the prediction of a, values for the other sigma levels. Again, a low level is used as the reference while D values for two higher sigma levels are used in calculations. The predicted a(sigma) values agree with the experimental ones within the limits of the experimental accuracy. Very close values of the Doolittle constant B are obtained from different subsets of minimum amounts of results and also from the full set of experiments for nine stress levels. The accuracy of the results is affected by the stress range covered (a wider range gives better results) but not by the amount of data used. (C) 2001 Published by Elsevier Science Ltd.