Thin Solid Films, Vol.367, No.1-2, 168-170, 2000
Influence of Mn content in MBE-grown Sn1-xMnxTe layers on their structural properties studied by X-ray diffraction
This work presents the results of X-ray diffractometric measurements performed on Sn1-xMnxTe heteroepitaxial layers grown using the molecular beam epitaxy (MBE) technique. The examinations included measurements of lattice constants, orientation, width of peak profiles and trace phases versus Mn content.