We report on the composition dependent structural properties of Pb1-xEuxSe thin films deposited by a co-evaporation method. X-ray diffraction studies have shown that all the films deposited over a composition range of x = 0.1 to 0.45 are polycrystalline in nature with sharp diffraction peaks independent of compositions and growth conditions. The lattice parameter of the films calculated using the strongest reflection (200) has been found to deviate from Vegard's law at higher compositions. The grain sizes have been found to be in the range of 100-450 Angstrom with (200) as the preferred orientation of the grains. The dependence of grain size and orientation on film composition and growth temperature has been studied in detail to understand the mechanisms governing the polycrystalline grain growth. The incorporation of europium and surface re-evaporation of selenium have been found to critically affect the polycrystalline grain growth.