Thin Solid Films, Vol.336, No.1-2, 38-41, 1998
TEM study of InAs self-assembled quantum dots in GaAs
InAs self-assembled quantum dots grown on GaAs(001) substrate vr ere investigated by TEM as well as by electrical transport measurements. The TEM analysis revealed the presence of a complicated triple-layer structure instead of simple dots far high In-concentrations. The electrical measurement suggest that the dots act as controllable scattering centers. A saturation of the mobility is observed for the highest dot density samples.