Thin film samples of Kapton HF polyamide have been modified by UV-radiation using a pulsed excimer laser with per pulse fluence ranging from 29-50 mJ/cm(2). The resulting samples have been characterized using Scanning Tunneling Microscopy, Atomic Force Microscopy. FTIR ATR spectroscopy and Surface Enhanced Raman Spectroscopy. Topographical results indicate that, as per pule fluence increases, surface melting, vaporization and eventually surface ablation occur. Raman results indicate the formation of graphitic carbon at the surface of the film. For highly modified samples the graphitic carbon exists in regions which exhibit localized structure on the nanometer scale. For these samples, only graphitic carbon is present at the surface of the film. For samples which involve a lesser degree of modification, both polyamide and carbon are present at the surface of the film, FTIR ATR results are consistent with a loss of crystallinity and an introduction of new conformational states in the bulk of the polyamide film due to subsurface heating.