Thin Solid Films, Vol.256, No.1-2, 253-256, 1995
On the Frequency Loss of Metal-Oxide-Semiconductor Structures Under Depletion and Weak Inversion
Admittance measurements of metal-oxide-semiconductor capacitors, along with published data, are considered from a new point of view. Accordingly, the spectral shape of frequency loss and polarization is well defined, and a novel approach of interpretation is necessary.