The molecular orientation in copper phthalocyanine (CuPc) films deposited on metal films of Au, Ag, Cu and Cr has been studied by reflection-absorption infrared spectroscopy and X-ray diffraction. The molecular planes of CuPc in the ultra-thin films (corresponding to several tens of monolayers) deposited on Au, Ag and Cu films were found to be nearly parallel to the metal film surfaces. Further deposition (up to 100 nm) on such thin films produces a molecular orientation with the molecular planes inclined away from the metal film surfaces. This corresponds to a crystal structure of the a phase with alpha standing b axis configuration. However, the molecular planes of the CuPc deposited on Cr films are rather perpendicular to the Cr film surfaces. These CuPc films are in the alpha phase with a parallel b axis configuration.