Two aspects of point contacts in solid state ionics are discussed : firstly, the consequences of unintentionally; existing ’poor’ contacts at interfaces are considered with regard to the frequency dependent potential distribution and the impedance response. A quantitative description is given using finite element calculations to determine the exact potential distribution. Secondly, the use of point contacts as tools to resolve the local environment in solids is demonstrated in two examples, the detection of a diffusion profile and the characterisation of a highly conductive surface layer in AgCl.