Previous Article Next Article Table of Contents Powder Technology, Vol.108, No.2-3, 95-102, 2000 DOI10.1016/S0032-5910(99)00206-5 Export Citation Development of advanced scanning electron microscopy techniques for characterization of submicron ash O'Keefe CA, Watne TM, Hurley JP Please enable JavaScript to view the comments powered by Disqus.