To predict the response of polyethylene thin films subjected to stress for a long time, it is necessary to understand the influence of stress on either the relaxation modulus or creep compliance. Extensive testing has been conducted on 20-micron-thick samples of a particular Linear low-density polyethylene film at temperatures from 23 degrees C to -50 degrees C. When reduced to creep compliance and compared with results from dynamic mechanical analysis (DMA), the influence of nonlinearities in the response function is apparent. However, the use of a two-step loading procedure has produced sufficient data to discriminate between the effect of stress on amplitude and time on the creep compliance. It has been found that a master curve of compliance generated by DMA equipment may be used in conjunction with certain nonlinear functions to accurately predict the response of the polyethylene. Perhaps of more importance is the observation that the principles of simple time-temperature superposition, commonly used with linear viscoelastic characterization, are insufficient for use with polyethylene films at most stress levels of interest.