We use synchrotron X-ray diffraction for structural analysis of the behavior of multilayer nitrogen films physisorbed on graphite foam. We provide structural information and concentrations of two- and three-dimensional solid phases at a coverage of Theta = 8 ML (Theta equivalent to 1 ML for a root 3 x root 3 monolayer structure) for temperatures from below the bulk alpha-beta transition temperature [Talpha-beta = 34 +/-0.5 K] to above the bulk triple point [T-tp = 63 K]. Our data indicate that layering begins near Talpha-beta, with subsequent layering occurring as the temperature is raised; all bulk nitrogen forms disordered film layers by 48 K at Theta = 8 mt. Our results are consistent with ellipsometry studies of nitrogen on highly oriented pyrolytic graphite which found multilayer nitrogen on single-crystal graphite to undergo a series of layering transitions above the bulk nitrogen alpha-beta structural transition. [Volkmann, U. G,Knorr, K. Phys. Rev. Lett. 1991, 66, 473.] The effect of adsorption on a graphite foam substrate, which results in capillary condensation and finite size effects, is limited to a broadening and overlap of the discrete transition temperatures observed on a single-crystal substrate. A phase diagram for coverages above 2 ML is proposed, summarizing this and previous work.