Journal of Vacuum Science & Technology B, Vol.16, No.5, 2825-2832, 1998
Oscillating contrast in room-temperature scanning tunneling microscope images of localized charges in III-V semiconductor cleavage surfaces
Positively and negatively charged defects and dopant atoms in n-doped GaAs(110) surfaces give rise, at room temperature, in occupied-state scanning tunneling microscope images to a bright elevation, which is surrounded by a dark depression ring. This oscillating contrast is not observed in empty-state images. A similar effect is found on n-doped GaP(110) surfaces. A simulation of the contrast induced by localized charges on (110) surfaces of III-V semiconductors suggests that the oscillation in room-temperature scanning tunneling microscope images can be explained as the image of the local potential change (screened Coulomb potential) induced by the presence of the charge.
Keywords:GAAS(110) SURFACES;INP(110) SURFACES;GAP(110) SURFACES;ANIONVACANCIES;POINT-DEFECTS;SPECTROSCOPY;ATOMS;GAAS