화학공학소재연구정보센터
Journal of Vacuum Science & Technology B, Vol.14, No.6, 4336-4340, 1996
X-Ray-Induced Mask Contamination and Particulate Monitoring in X-Ray Steppers
The belief that proximity x-ray lithography is insensitive to contamination has been based on the assumption that contaminants are small hydrocarbon compounds. However, we will show that x rays may induce photoassisted processes that deposit saltlike films on the mask surface. We will also provide an explanation for the film geometry in the early stages of its growth and suggest some possible solutions to the issue.