Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.13, No.3, 1290-1293, 1995 DOI10.1116/1.587840 Export Citation Nanolithographic Patterning of Au Films with a Scanning Tunneling Microscope Vanhaesendonck C, Stockman L, Neuttiens G, Strunk C, Bruynseraede Y Keywords:UNIVERSAL CONDUCTANCE FLUCTUATIONS;THIN GOLD-FILMS;E-BEAM RESIST;METALS Please enable JavaScript to view the comments powered by Disqus.
