Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.13, No.3, 1063-1065, 1995 DOI10.1116/1.587905 Export Citation Thermal Contraction of Ultrahigh-Vacuum Materials for Scanning Probe Microscopy from 300 to 4 K Nunes G, Williams D Keywords:TUNNELING MICROSCOPE;LOW-TEMPERATURE Please enable JavaScript to view the comments powered by Disqus.
