Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.13, No.2, 540-544, 1995 DOI10.1116/1.588350 Export Citation Numerical-Analysis on Field-Emission for the Effects of the Gate Insulators Ahn HY, Lee CG, Lee JD Keywords:SIMULATION;DEVICE;TRIODE Please enable JavaScript to view the comments powered by Disqus.
