Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.13, No.2, 522-525, 1995 DOI10.1116/1.588346 Export Citation Calculation of Local-Density of States at an Atomically Sharp Si Tip Huang ZH, Cutler PH, Miskovsky NM, Sullivan TE Keywords:SCANNING TUNNELING MICROSCOPE;FIELD-EMISSION;ELECTRONIC-STRUCTURE;ATOM Please enable JavaScript to view the comments powered by Disqus.
