Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.13, No.2, 335-337, 1995 DOI10.1116/1.588376 Export Citation Polycrystalline Tungsten and Iridium Probe Tip Preparation with a Ga+ Focused Ion-Beam Hopkins LC, Griffith JE, Harriott LR, Vasile MJ Keywords:SCANNING TUNNELING MICROSCOPY;METROLOGY;GEOMETRY Please enable JavaScript to view the comments powered by Disqus.
