Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.13, No.1, 69-76, 1995 DOI10.1116/1.587988 Export Citation Characterization of the Si/GaAs(110) Interface by Soft-X-Ray Surface X-Ray-Absorption Fine-Structure Hasnaoui ML, Flank AM, Delaunay R, Lagarde P Keywords:GAAS(110) SURFACE;HETEROJUNCTION;DISCONTINUITY;DIFFRACTION;SI Please enable JavaScript to view the comments powered by Disqus.
