Journal of Vacuum Science & Technology B, Vol.12, No.6, 3712-3715, 1994
Reduced Electron Transmission in Au/GaAs Diodes Damaged by Focused Ion-Beam Implantation Studied by Ballistic-Electron-Emission Microscopy
Keywords:GALLIUM-ARSENIDE;SCHOTTKY-BARRIER;BAND-STRUCTURE;INTERFACE;GAAS;SPECTROSCOPY;SCATTERING;GOLD;DEFECTS