Journal of Vacuum Science & Technology A, Vol.14, No.1, 22-29, 1996
Surface-Diffusion of in on Si(111) - Evidence for Surface-Ionization Effects
Second harmonic microscopy has been used to quantify the surface diffusion of In on Si(111). At temperatures near 50% of the bulk melting temperature and in the coverage range 0
Keywords:METAL-SURFACES;X-RAY;SILICON;DESORPTION;INDIUM;SEMICONDUCTORS;ADSORBATES;MICROSCOPY;ADSORPTION;KINETICS