Ultrahigh-vacuum scanning force microscopy (UHV SFM) was used to measure force-distance (FD) interactions between electrochemically etched clean and oxidized tungsten tips and an in situ deposited lithium berate film. For the case of the oxidized tip, application of a potential difference between the tip and sample allowed Lithium to be cycled into and back out of the oxide layer in the tungsten tip. Reproducible changes in the shape and magnitude of the force-distance interaction were observed.