Process and configuration dependent carrier-selective Ag/ITO/MoOx/n-Si/LiFx/Al silicon solar cells having conversion efficiencies from 6.5% to 14.5% are investigated. Some of the cells' anomalous characteristics in light J-V and Suns-V-OC graphs are analysed by photo-induced capacitance-voltage (C-V), impedance spectroscopy (IS), and voltage-plus light-biased (white, blue and infrared) quantum efficiency (QE). Correlated analysis of cells revealed the physical origin of S-shape in light J-V and turnaround in Suns-V-OC graphs. After air exposure of the MoOx film, the charge carrier accumulation at the front interface and inefficient transport through the MoOx layer have led to the anomalous features in light J-V and Suns-VOC graphs of the cell. This is reflected as an additional peak and arc in C-V and IS graphs, respectively. In the absence of the LiFx layer, the cell has shown the only turnaround in Suns-V-OC graph due to the Schottky barrier. The IS analysis resolved carrier transport issues at the front junction and back contact of the cells with a distinguished response. The light-bias dependent QE analysis has confirmed the presence of carrier collection barrier at the MoOx/c-Si interface, and the Schottky contact at the back with a different response in EQE spectra.