화학공학소재연구정보센터
Journal of the American Ceramic Society, Vol.103, No.1, 423-431, 2020
Microwave dielectric properties of temperature-stable zircon-type (Bi, Ce)VO4 solid solution ceramics
In the (Bi1 - xCex)VO4 (0 <= x <= 1) system, we found that the (Bi1 - xCex)VO4 (0 <= x <= 0.1) belongs to the monoclinic scheelite phase and the (Bi1 - xCex)VO4 (0.7 <= x <= 1) belongs to the tetragonal zircon phase, while the (Bi1 - xCex)VO4 (0.1 x < 0.7) belongs to the mixed phases of both monoclinic scheelite and tetragonal zircon structure. Interestingly, two components with near-zero temperature coefficient of resonant frequency (TCF) appeared in this system. In our previous work, a near-zero TCF of similar to+15 ppm/degrees C was obtained in a (Bi0.75Ce0.25)VO4 ceramic with a permittivity (epsilon(r)) of similar to 47.9 and a Qf (Q = quality factor = 1/dielectric loss; f = resonant frequency) value of similar to 18 000 GHz (at 7.6 GHz). Furthermore, in the present work, another temperature-stable microwave dielectric ceramic was obtained in (Bi0.05Ce0.95)VO4 composition sintered at 950 degrees C and exhibits good microwave dielectric properties with a epsilon(r) of similar to 11.9, a Qf of similar to 22 360 GHz (at 10.6 GHz), and a near-zero TCF of similar to+6.6 ppm/degrees C. The results indicate that this system might be an interesting candidate for microwave device applications.