Bilayers of the ferroelectric polymer poly(vinylidene fluoride-trifluoroethylene), P(VDF-TrFE) on semiconducting poly(3-hexyl thiophene) substrates have been prepared by sequential spin-coating. Here, we present a study of the polarization of this ferroelectric/semiconducting bilayer as a function of the semiconductor thickness by piezoresponse force microscopy. The structural and morphological details have been investigated by a combination of grazing incidence wide-angle X-ray scattering and contact angle measurements. The obtained results show that the presence of a semiconducting polymer layer between a silicon substrate and the ferroelectric polymer layer stabilizes the polarization induced by an external field.