Outdoor short-circuit current (I-SC) of test photovoltaic (PV) modules, i.e., (1) multi-crystalline silicon, (2) heterostructure-with-intrinsic-thin-layer, (3) single-crystalline silicon back-contact, (4) CuInSe2, and (5) CdTe modules, was evaluated using single-crystalline silicon (sc-Si) PV module as PV module irradiance (Irr) sensor (PVMS). PVMS is used to estimate simultaneous Irr and spectral mismatch correction factor (MMPVMS). The measured Isc (I-SC(-meas)) of the test PV modules at outdoor location under various conditions was corrected to the Isc under standard test condition (STC) for the corrected Isc (I-SC(-corrected)) using the MMPVMS and simultaneous Irr, yielding the description of the degradation of the test PV modules for the credibility of their fabrication technology. Moreover, the estimation of I-SC(-corrected) of the test PV modules under different Irr levels was performed. The I-SC(-corrected) with high precision, close to I-SC under STC, was obtained under Irr level of >= 0.2 sun, observed by the PVMS. This leads to the increase the investigation opportunity on both sunny day and cloudy day. The I-SC(-corrected) with the highest precision is moreover obtained under Irr level of >= 0.7 sun. The method using the simultaneous lrr and MMpvms observed by the PVMS could be applicable under the large fluctuation of the lrr levels. (C) 2019 Elsevier Ltd. All rights reserved.