In order to better understand the properties and composition of solids pf polyfluorinated C-60, X-ray photoelectron spectroscopy (XPS) was used to characterize several different C60Fx samples synthesized in two different laboratories. Quantitative measurements of the F-1s, C-1s and O-1s, XPS signals established the elemental stoichiometry of each sample. The F/C ratios for the different samples ranged from 28/60 to 53/60 in general agreement with previous mass spectroscopy studies of each sample. C-1s energies and shifts as well as solid-state nuclear magnetic resonance studies provided additional information about the degree of fluorination and level bf C-C bond breaking.