The atomic force microscopy (AFM) technique has been developed to study the sublimation rare of an organic solid film on smooth surfaces. On the basis of the experimental results, a dipole-induced dipole propagation potential is employed to explain a nonlinear sublimation fate of a solid TNT thin film in a very close proximity to the substrate surface. In this model, three important physical parameters, the bulk sublimation rate delta(o), surface interaction potential U-o, and the effective decay length of the surface potential h(o), are introduced without any arbitrary constants. It is argued that the model-reflects a general phenomena rather than a special case.