화학공학소재연구정보센터
Journal of Crystal Growth, Vol.483, 318-322, 2018
Growth and characterization of an Al-doped GaSe crystal
A GaSe: Al (0.13 wt%) single crystal was grown using the Bridgman method combined with a crucible rotation technique. A 35 x 19 x 5.5 mm(3) sample was cut from the as-grown crystal ingot. The GaSe: Al (0.13 wt%) crystal has an indentation hardness of 2.27 GPa, which is 2.6 times harder than the pure GaSe crystal. In particular, a sample with a thickness of 5.5 mm has an infrared transmission of approximately 60%. The absorption coefficient of this sample is as low as 0.1 cm(-1) over the range of 0.83 to -14 mu m, which demonstrates its high optical quality. A crystal growth method with the described procedures may be suitable to grow other doped GaSe crystals. (C) 2017 Published by Elsevier B.V.