Domain Wall Motions in a Near-Morphotropic PZT during a Stepwise Poling Observed by Piezoresponse Force Microscopy

Kwanlae Kim

Korean Journal of Materials Research, Vol.27, No.9, 484-488, September, 2017

DOI10.3740/MRSK.2017.27.9.484 Export Citation

Domain Wall Motions in a Near-Morphotropic PZT during a Stepwise Poling Observed by Piezoresponse Force Microscopy

Kwanlae Kim^{1, 2, †}

¹Department of Engineering Science, University of Oxford, Oxford OX1 3PJ, United Kingdom, UK
²Department of Materials Science and Engineering, Yonsei University, Seoul 03722, Republic of Korea

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In the present study, domain evolution processes of a near-morphotropic PZT ceramic during poling was studied using vertical piezoresponse force microscopy (PFM). To perform macroscopic poling in bulk polycrystalline PZT, poling was carried out in a stepwise fashion, and PFM scan was performed after unloading the electric field. To identify the crystallographic orientation and planes for the observed non-180 ° domain walls in the PFM images, compatibility theory and electron backscatter diffraction (EBSD) were used in conjunction with PFM. Accurate registration between PFM and the EBSD image quality map was carried out by mapping several grains on the sample surface. A herringbone-like domain pattern consisting of two sets of lamellae was observed; this structure evolved into a single set of lamellae during the stepwise poling process. The mechanism underlying the observed domain evolution process was interpreted as showing that the growth of lamellae is determined by the potential energy associated with polarization and an externally applied electric field.

Keywords:piezoresponse force microscopy;PZT;EBSD;poling;domain structure

[References]

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[1] Arlt G, Ferroelectrics, 104, 217 (1990)

[2] Wang J, Shi SQ, Chen LQ, Li Y, Zhang TY, Acta Mater., 52, 749 (2004)

[3] Potter BG, Tikare V, Tuttle BA, J. Appl. Phys., 87, 4415 (2000)

[4] Britson J, Gao P, Pan X, Chen LQ, Acta Mater., 112, 285 (2016)

[5] Guo H, Liu X, Xue F, Chen LQ, Hong W, Tan X, Phys. Rev. B, 93, 174114 (2016)

[6] Hart JL, Liu S, Lang AC, Hubert A, Zukauskas A, Canalias C, Beanland R, Rappe AM, Arredondo M, Taheri ML, Phys. Rev. B, 94, 174104 (2016)

[7] Soergel E, Appl. Phys. B-Lasers Opt., 81, 729 (2005)

[8] Kalinin SV, Rar A, Jesse S, IEEE Trans. Ultrason. Ferroelectr. Freq. Control, 53, 2226 (2006).

[9] Kalinin SV, Balke N, Adv. Eng. Mater., 22, E193 (2010)

[10] Soergel E, J. Phys. D-Appl. Phys., 44, 464003 (2011)

[11] Denning D, Guyonnet J, Rodriguez BJ, Int. Mater. Rev., 61, 46 (2016)

[12] Rodriguez BJ, Callahan C, Kalinin SV, Proksch R, Nanotechnology, 18, 475504 (2007)

[13] Jesse S, Kalinin SV, Proksch R, Baddorf AP, Rodriguez BJ, Nanotechnology, 18, 435503 (2007)

[14] Kalinin SV, Strelcov E, Belianinov A, Somnath S, Vasudevan RK, Lingerfelt EJ, Archibald RK, Chen C, Proksch R, Laanait N, Jesse S, ACS nano, 10, 9068 (2016)

[15] Kalinin SV, Rodriguez BJ, Jesse S, Shin J, Baddorf AP, Gupta P, Jain H, Williams DB, Gruverman A, Microsc. Microanal., 12, 206 (2006)

[16] Gruverman A, Auciello O, Tokumoto H, Annu. Rev. Mater. Sci., 28, 101 (1998)

[17] Sawyer CB, Tower CH, Phys. Rev., 35, 269 (1930)

[18] Shu YC, Bhattacharya K, Philos. Mag. B-Phys. Condens. Matter Stat. Mech. Electron. Opt. Magn. Prop., 81, 2021 (2001)

[19] Qi XY, Liu HH, Duan XF, Appl. Phys. Lett., 89, 092908 (2006)