Scanning Kelvin probe force microscopy has been employed to examine the behavior of second phase carbide particles in beryllium at different relative humidity levels and after exposure to deionized water. Carbides are believed to have a role in the localized corrosion of beryllium as a result of their hydrolysis when exposed at the metal surface. The presence of beryllium carbide was confirmed by means of Auger electron spectroscopy and the particles were further characterized by scanning electron microscopy, energy/wavelength dispersive X-ray spectroscopy and scanning Kelvin probe force microscopy. The particles were found to have a more noble Volta potential than the beryllium matrix and a decrease in the Volta potential difference between the second phase particles and the matrix was observed as the humidity was increased. A thick beryllium oxide/hydroxide layer then formed on the particles following exposure to water significantly reducing their potential. (C) 2017 The Electrochemical Society. All rights reserved.