Electrode coatings of 40%RuO2-60%ZrO2 binary oxide were formed on Ti substrate by thermal decomposition method with the annealing temperature varying from 280 degrees C to 450 degrees C. The effects of annealing temperature on the structure, capacitive performance of the electrode coatings were investigated using X-ray diffraction analysis (XRD), transmission electron microscopy (TEM) and cyclic voltammetry. The XRD and TEM analyses showed that 290 degrees C was the critical crystallization temperature of RuO2. The 40%RuO2-60%ZrO2 oxide coating prepared at this temperature also exhibited the highest specific capacitance (949 F/g), owing to its special amorphous structure in combination with short range order microcrystallines, which brought out both the relatively good electrical and proton conductivity. (C) 2017 Elsevier B.V. All rights reserved.